)]}' { "commit": "8dee14559fcbbc09ac8e675505fc30889bebadeb", "tree": "af8a5824ef20dd49829b6d0b529262d95ee4e6d1", "parents": [ "608316501d59f3f297d061f493c80dc5096e57a4" ], "author": { "name": "Yuta HIGUCHI", "email": "y-higuchi@ak.jp.nec.com", "time": "Wed May 02 19:09:04 2018 -0700" }, "committer": { "name": "Yuta HIGUCHI", "email": "y-higuchi@ak.jp.nec.com", "time": "Wed May 02 19:09:04 2018 -0700" }, "message": "Improve microsemi unit test run time\n\nChange-Id: Id1a5ad9d7e47dabde61d16aced464510d0818c42\n", "tree_diff": [ { "type": "modify", "old_id": "1f8763424e946e6f9e756aefb86c7167016ce43d", "old_mode": 33188, "old_path": "drivers/microsemi/ea1000/src/test/java/org/onosproject/drivers/microsemi/EA1000CfmMepProgrammableTest.java", "new_id": "fbfbb136d30d7207363d606c3ec27c2b155d504b", "new_mode": 33188, "new_path": "drivers/microsemi/ea1000/src/test/java/org/onosproject/drivers/microsemi/EA1000CfmMepProgrammableTest.java" }, { "type": "modify", "old_id": "aa04dab19e24ed4c97dcbb9cfceff762912953d6", "old_mode": 33188, "old_path": "drivers/microsemi/ea1000/src/test/java/org/onosproject/drivers/microsemi/EA1000FlowRuleProgrammableTest.java", "new_id": "fe955829edbf5448c92ee8b2af23d9882b34f6ec", "new_mode": 33188, "new_path": "drivers/microsemi/ea1000/src/test/java/org/onosproject/drivers/microsemi/EA1000FlowRuleProgrammableTest.java" }, { "type": "modify", "old_id": "59c674e5fa282fd1f95f5587a2287d8ee726c6d0", "old_mode": 33188, "old_path": "drivers/microsemi/ea1000/src/test/java/org/onosproject/drivers/microsemi/EA1000SoamDmProgrammableTest.java", "new_id": "7017bd688915ead5cdccecc46f40650368bf4de4", "new_mode": 33188, "new_path": "drivers/microsemi/ea1000/src/test/java/org/onosproject/drivers/microsemi/EA1000SoamDmProgrammableTest.java" }, { "type": "modify", "old_id": "bb65a4de57a1683039f68e226812ccb07ab1cad3", "old_mode": 33188, "old_path": "drivers/microsemi/ea1000/src/test/java/org/onosproject/drivers/microsemi/yang/MseaCfmManagerTest.java", "new_id": "161621b25d3586e6d4e1c6f630df56da0c94e81e", "new_mode": 33188, "new_path": "drivers/microsemi/ea1000/src/test/java/org/onosproject/drivers/microsemi/yang/MseaCfmManagerTest.java" }, { "type": "modify", "old_id": "bb931f0459804a6e64a1a3177a8d613a1fb6d316", "old_mode": 33188, "old_path": "drivers/microsemi/ea1000/src/test/java/org/onosproject/yang/serializers/xml/MockYangSerializerContext.java", "new_id": "f5c075326ec54c5907db6ccd71f85b23223dd814", "new_mode": 33188, "new_path": "drivers/microsemi/ea1000/src/test/java/org/onosproject/yang/serializers/xml/MockYangSerializerContext.java" } ] }