tree af8a5824ef20dd49829b6d0b529262d95ee4e6d1
parent 608316501d59f3f297d061f493c80dc5096e57a4
author Yuta HIGUCHI <y-higuchi@ak.jp.nec.com> 1525313344 -0700
committer Yuta HIGUCHI <y-higuchi@ak.jp.nec.com> 1525313344 -0700

Improve microsemi unit test run time

Change-Id: Id1a5ad9d7e47dabde61d16aced464510d0818c42